VACUUM-UV FLUORESCENCE SPECTROSCOPY OF SIF4 IN THE RANGE 10-30 EV
VACUUM-UV FLUORESCENCE SPECTROSCOPY OF SIF4 IN THE RANGE 10-30 EV
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10-30 EV 范围内 SIF4 的真空-紫外荧光光谱
DOI:
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发表时间:
1997
期刊:
影响因子:
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通讯作者:
H. Jochims
中科院分区:
文献类型:
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作者:
H. Biehl;K. J. Boyle;D. Seccombe;D. Smith;R. Tuckett;K. R. Yoxall;H. Baumgärtel;H. Jochims
The vacuum-UV and visible spectroscopy of SiF4 using fluorescence excitation and dispersed emission techniques is reported. The fluorescence excitation spectrum has been recorded following excitation with synchrotron radiation from the BESSY 1, Berlin source in the energy range 10–30 eV with an average resolution of ∼0.05 eV. By comparison with vacuum-UV absorption and electron energy loss spectra, all the peaks in the Rydberg spectra that photodissociate to a fluorescing state of a fragment have been assigned. Dispersed emission spectra have been recorded at the energies of all the peaks in the excitation spectra. Four different decay channels are observed: (a) SiF3 fluorescence in the range 380–650 nm for photon energies around 13.0 eV, (b) SiF2 a 3B1–X 1A1 phosphorescence in the range 360–440 nm for photon energies in the range 15.2–18.0 eV, (c) SiF2 A 1B1–X 1A1 fluorescence in the range 210–270 nm for photon energies in the range 17.0–20.0 eV, and (d) emission from the D 2A1 state of SiF4+ predomin...