Identification of Intervening Materials in Gamma-Ray Spectroscopy Measurements Using Angularly Deconvolved Spectra With Multiple Sources in the Field of View
Identification of Intervening Materials in Gamma-Ray Spectroscopy Measurements Using Angularly Deconvolved Spectra With Multiple Sources in the Field of View
复制标题
使用视场内多个源的角度解卷积光谱来识别伽马射线光谱测量中的干扰材料
DOI：
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发表时间：
2018
影响因子：
1.8
通讯作者：
Zhong He
中科院分区：
文献类型：
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作者：
D. Goodman;M. Streicher;Yuefeng Zhu;Zhong He
屏蔽发射多种可分辨伽马射线能量的放射源的材料的质量厚度和原子序数可以通过测量记录光谱中发射的伽马射线的衰减和康普顿散射与一组材料和厚度的估计值来表征。使用基于最大似然期望最大化的重建的康普顿成像可用于分离角谱，从而允许同时表征多个屏蔽源。在实验 133Ba 数据上使用所描述的算法，我们演示了对视场中另一个裸源的铁、锡和铅屏蔽的质量厚度和原子序数的估计，平均标准误差分别为 0.6 g/cm2 和 1.5，而铝屏蔽则以模糊的原子序数但正确的厚度重建。
The mass thickness and atomic number of materials shielding radioactive sources emitting multiple resolvable gamma-ray energies can be characterized by measuring the attenuation and Compton scatter of emitted gamma rays in recorded spectra against estimated values for a suite of materials and thicknesses. Compton imaging using a maximum-likelihood expectation maximization-based reconstruction can be used to separate angular spectra allowing simultaneous characterization of multiple shielded sources. Using the described algorithm on experimental 133Ba data, we demonstrate estimation of mass thickness and atomic number for iron, tin, and lead shields with another bare source in the field of view with average standard error of 0.6 g/cm2 and 1.5, respectively, while an aluminum shield is reconstructed with ambiguous atomic number but correct thickness.