Enhanced charge excitations in electron-doped cuprates by resonant inelastic x-ray scattering
Enhanced charge excitations in electron-doped cuprates by resonant inelastic x-ray scattering
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DOI：
10.1103/physrevb.92.014515
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发表时间：
2015-03
影响因子：
3.7
通讯作者：
T. Tohyama;K. Tsutsui;M. Mori;S. Sota;S. Yunoki
中科院分区：
文献类型：
--
作者：
T. Tohyama;K. Tsutsui;M. Mori;S. Sota;S. Yunoki
针对 Cu L 边缘调谐的共振非弹性 X 射线散射 (RIXS) 是检测铜酸盐超导体中电荷激发的可能工具。我们从理论上研究了 RIXS 观察集体电荷激发的可能性。通过中间态的 RIXS 过程不可避免地使电子掺杂中的电荷激发的光谱权重强于空穴掺杂中的电荷激发光谱权重。电子空穴不对称性也出现在动态电荷结构因子中，显示出电子掺杂中新的增强型小动量低能模式。这些事实表明通过 RIXS 在电子掺杂系统中检测新电荷模式的可能性。
Resonant inelastic x-ray scattering (RIXS) tuned for the Cu L edge is a possible tool to detect charge excitations in cuprate superconductors. We theoretically investigate the possibility for observing a collective charge excitation by the RIXS. The RIXS process via the intermediate state inevitably makes the spectral weight of charge excitation stronger in electron doping than in hole doping. Electron-hole asymmetry also appears in the dynamical charge structure factor, showing a new enhanced small-momentum low-energy mode in electron doping. These facts indicate a possibility of detecting the new charge mode by RIXS in electron-doped systems.