Electrical Impedance Tomography by Elastic Deformation

Electrical Impedance Tomography by Elastic Deformation
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DOI:
10.1137/070686408
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发表时间:
2008-06
期刊:
SIAM J. Appl. Math.
影响因子:
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通讯作者:
H. Ammari;E. Bonnetier;Yves Capdeboscq;M. Tanter;M. Fink
H. Ammari;E. Bonnetier;Yves Capdeboscq;M. Tanter;M. Fink
中科院分区:
其他
文献类型:
--
作者:
H. Ammari;E. Bonnetier;Yves Capdeboscq;M. Tanter;M. Fink

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