Point contact Andreev reflection by nanoindentation of polymethyl methacrylate
Point contact Andreev reflection by nanoindentation of polymethyl methacrylate
复制标题
聚甲基丙烯酸甲酯纳米压痕的点接触安德烈夫反射
DOI：
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发表时间：
2006
期刊：
影响因子：
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通讯作者：
J. Coey
中科院分区：
文献类型：
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作者：
E. Clifford;J. Coey
一种通过点接触安德烈夫反射进行自旋偏振测量的通用技术已经开发出来。该技术涉及使用原子力显微镜作为纳米压痕仪，通过光刻胶层中形成的纳米孔将超导体（铅）沉积到待研究材料的薄膜上。使用铜和镍来演示该方法。还测量了 CrO2 和 Co2MnSi 的极化率，前者的极化率为 95%，正如预期的那样，后者的极化率为 20%，这对于候选半金属来说出人意料地低。
A versatile technique for performing spin polarization measurements via point contact Andreev reflection has been developed. This technique involves depositing a superconductor (lead) onto a thin film of the material to be studied through a nanohole formed in a layer of photoresist, using an atomic force microscope as a nanoindenter. Copper and nickel were used to demonstrate the method. The polarizations of CrO2 and Co2MnSi were also measured, the former giving a value of 95%, as expected, and the latter giving 20%, which was surprisingly low for a candidate half metal.