Paraxial charge compensator for electron cryomicroscopy
Paraxial charge compensator for electron cryomicroscopy
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DOI:
10.1016/j.ultramic.2012.03.006
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发表时间:
2012-05-01
期刊:
影响因子:
2.2
通讯作者:
Rosenthal, Peter B.
中科院分区:
文献类型:
--
作者:
Berriman, John A.;Rosenthal, Peter B.
We describe a multi-hole condenser aperture for the production of several electron beams in the transmission electron microscope (TEM) making it possible to simultaneously image and irradiate spatially separated regions of a specimen. When the specimen is a thin film of vitreous ice suspended over a holey carbon film, simultaneous irradiation of the adjacent carbon support with the off-axis beam compensates for some of the effects of charging in the image formed by a beam irradiating only the ice. Because the intervening region is not irradiated, charge-neutralization of frozen-hydrated specimens can occur by a through-space mechanism such as the emission of secondary electrons from a grounded carbon support film. We use paraxial charge compensation (PCC) to control the amount of charge build-up on the specimen and observe the effects of charge on images. The multi-hole aperture thus provides a tool for investigating the mechanism of charging and charge mitigation during the imaging of radiation sensitive biological specimens by cryomicroscopy. (C) 2012 Elsevier B.V. All rights reserved.