Improvement of minimum paint film thickness for THz paint meters by multiple-regression analysis.
Improvement of minimum paint film thickness for THz paint meters by multiple-regression analysis.
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DOI：
10.1364/ao.46.007518
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发表时间：
2007-10
期刊：
影响因子：
1.9
通讯作者：
T. Yasuda;T. Iwata;T. Araki;T. Yasui
中科院分区：
文献类型：
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作者：
T. Yasuda;T. Iwata;T. Araki;T. Yasui
提出了一种数值参数拟合法来确定太赫兹(THz)层析成像测量中两个时间重叠的回波脉冲之间的时延。该方法是基于最小二乘法的多元回归分析，并应用于降低太赫兹色度计的最小漆膜厚度。将多元回归分析应用于涂料厚度测量，对于最小厚度的敏感性是数值傅立叶反卷积的五倍。应用该方法确定了干漆膜和湿漆膜的光学厚度、几何厚度和群折射率。该方法对于减小太赫兹涂料仪的最小厚度和其他太赫兹层析成像测量是有用的。
We propose a numerical parameter fitting method to determine the time delay between two temporally overlapped echo pulses in terahertz (THz) tomography measurements. The method is based on multiple-regression analysis with the least-squares method and is applied to decrease the minimum paint film thickness for THz paint meters. Applying multiple-regression analysis to paint thickness measurements is five times more sensitive with regard to the minimum thickness than numerical Fourier deconvolution. We apply the proposed method to determine the optical thickness, geometrical thickness, and group refractive index of dry paint film and wet paint film. The proposed method is useful for decreasing the minimum thickness for a THz paint meter and other THz tomography measurements.