Mechanical vertical manipulation of selected single atoms by soft nanoindentation using near contact atomic force microscopy
Mechanical vertical manipulation of selected single atoms by soft nanoindentation using near contact atomic force microscopy
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DOI：
10.1103/physrevlett.90.176102
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发表时间：
2003-05-02
影响因子：
8.6
通讯作者：
Morita, S
中科院分区：
文献类型：
--
作者：
Oyabu, N;Custance, O;Morita, S
在低温下操作的近接触原子力显微镜用于从Si(111)-(7x7)表面选择单个原子的垂直操作。在软纳米压痕过程中，尖端和表面最近的原子之间的强排斥性短程化学力相互作用导致选定的硅原子从表面的平衡位置移除，而不会对（7x7）单元胞产生额外的扰动。在表面形成的空位上也实现了单个原子的沉积。这些操作过程是纯机械的，因为在探针和样品之间既不施加偏置电压，也不施加电压脉冲。在载荷作用下，两种非等效Si(111)-(7x7)原子的力学响应差异也被检测到。
A near contact atomic force microscope operated at low-temperature is used for vertical manipulation of selected single atoms from the Si(111)-(7x7) surface. The strong repulsive short-range chemical force interaction between the closest atoms of both tip apex and surface during a soft nanoindentation leads to the removal of a selected silicon atom from its equilibrium position at the surface without additional perturbation of the (7x7) unit cell. Deposition of a single atom on a created vacancy at the surface is achieved as well. These manipulation processes are purely mechanical, since neither bias voltage nor voltage pulse is applied between probe and sample. Differences in the mechanical response of the two nonequivalent adatoms of the Si(111)-(7x7) with the load applied is also detected.