Anomalous X-ray scattering studies on semiconducting and metallic glasses
Anomalous X-ray scattering studies on semiconducting and metallic glasses
复制标题
半导体和金属玻璃的反常 X 射线散射研究
DOI:
10.1140/epjst/e2012-01625-0
复制
发表时间:
2012
期刊:
影响因子:
--
通讯作者:
S. Kohara
中科院分区:
文献类型:
--
作者:
S. Hosokawa;W. Pilgrim;J. Bérar;S. Kohara
In order to explore local- and intermediate-range atomic structures of several semiconducting and metallic glasses, anomalous X-ray scattering (AXS) experiments were performed using an improved detecting system suitable for third-generation synchrotron radiation facilities, and the obtained data were analyzed using reverse Monte Carlo (RMC) modelling to obtain partial structure factors and to construct three-dimensional atomic configurations of these glasses. Examples of GeSe2semiconducting and Pd40Ni40P20metallic glasses are demonstrated to exhibit the feasibility of the combination of AXS and RMC techniques. Importance of an additional combination with neutron scattering is also described for alloys containing light elements.
DOI:
10.1088/0953-8984/22/40/404203
发表时间:
2010-10
期刊:
Journal of Physics: Condensed Matter
影响因子:
--
作者:
Koji Ohara;Y. Kawakita;László Pusztai;L. Temleitner;Shinji Kohara;Naoki Inoue;S. Takeda
通讯作者:
Koji Ohara;Y. Kawakita;László Pusztai;L. Temleitner;Shinji Kohara;Naoki Inoue;S. Takeda