Application of Electron Probe Microanalysis to the Study of Geological and Planetary Materials
Application of Electron Probe Microanalysis to the Study of Geological and Planetary Materials
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DOI：
10.1007/s100050010081
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发表时间：
2001-03
影响因子：
2.8
通讯作者：
J. Mcgee;K. Keil
中科院分区：
文献类型：
--
作者：
J. Mcgee;K. Keil
电子探针显微分析对地质和行星材料研究的影响是巨大的。随着仪器能力的提高和对地质/行星材料的应用扩展，电子微探针逐渐成为地质研究实验室的常规分析仪器。本文介绍了电子探针显微分析对地球上和地球外矿物的表征以及对其他重要地质研究，如轻元素分析、微量元素分析和元素填图的贡献。
The impact of electron probe microanalysis on the study of geological and planetary materials has been tremendous. Electron microprobes evolved into routine analytical instruments in geological research laboratories as instrument capabilities improved and applications to geologic/planetary materials expanded. The contributions of electron probe microanalysis to the characterization of minerals, both terrestrial and extraterrestrial, and to other significant geological research, such as light element analysis, trace element analysis, and element mapping, is described.