Measuring the effective channel length of MOSFETs

Measuring the effective channel length of MOSFETs
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测量 MOSFET 的有效沟道长度

DOI:
10.1109/101.100256
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发表时间:
1990
期刊:
IEEE Circuits and Devices Magazine
影响因子:
--
通讯作者:
J. Brews
J. Brews
中科院分区:
--
文献类型:
--
作者:
K. Ng;J. Brews

文献摘要

被引文献

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概述了11种测量方法,并检验了它们的假设。对这些方法进行了分析、批评和比较。对于在不同条件下哪种方法是最好的,给出了建议。
Eleven measurement methods are outlined, and their assumptions are examined. The methods are analyzed, critiqued, and compared. Recommendations are made as to which methods are best under various conditions.<<ETX>>