Pressure-Induced Magnetoresistance in NbSe 3
Pressure-Induced Magnetoresistance in NbSe 3
复制标题
NbSe 3 中的压力感应磁阻
DOI:
10.1143/jpsj.69.3470
复制
发表时间:
2000
影响因子:
1.7
通讯作者:
K. Yamaya
中科院分区:
文献类型:
--
作者:
S. Yasuzuka;Y. Okajima;S. Tanda;N. Takeshita;N. Mōri;K. Yamaya
Bridgman anvil device was employed in order to generate high pressure with H parallel to the a∗-axis. Figure 1 shows the temperature dependence of resistance (left-hand scale) for H = 0 and 12 T and the MR for H = 12 T (right-hand scale) between 0 and 80 K at P = 0 kbar. The magnetic field enhances the resistance anomaly due to the T2-CDW formation (T2 = 55 K at H = 0 T). A large ∆ρ/ρ0 appears immediately upon the formation of the the T2-CDW phase; a LMR is observed below T2. However, above T2 ∆ρ/ρ0 is negligibly small. T2 is independent of the magnetic fields within our experimental error of ±0.5 K. These results agree well with previous results. Figure 2 shows the temperature dependence of resistance (left-hand scale) for H = 0 and 12 T and the MR for H = 12 T (right-hand scale) between 0 and 40 K at P = 7.2 kbar. The T2-CDW transition temperature (T2 = 23 K) and the resistance anomaly associated with T2-CDW formation are suppressed by increased pressure. Despite the considerable suppression of the T2-CDW phase however, a large hump in resistance can clearly be observed below T2 for H = 12 T. Again, ∆ρ/ρ0 increases below T2, and a LMR is observed even under pressure. These results agree with our previous results measured for H parallel to the c-axis. By contrast, ∆ρ/ρ0 is small above T2, with a magnitude of about 0.1 at 30 K. However, this value is about two orders of magnitude larger than that at ambient pressure, which is about 3×10−3 at 70 K. Even if the temperature factor is considered in the temperature dependence of ∆ρ/ρ0 ∼ (ωcτ ), where ωc is the cyclotron frequency and τ is the relaxation time, the ∆ρ/ρ0 above T2 obtained at 7.2 kbar is significantly large. This indicates the new appearance of the MR Journal of the Physical Society of Japan Vol. 69, No. 10, October, 2000, pp. 3470-3471 Short Notes