Development of advanced x-ray imaging crystal spectrometer utilizing a large area segmented proportional counter for KSTAR.

Development of advanced x-ray imaging crystal spectrometer utilizing a large area segmented proportional counter for KSTAR.
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DOI:
10.1063/1.2749441
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发表时间:
2007-06
期刊:
The Review of scientific instruments
影响因子:
--
通讯作者:
S. G. Lee;J. Bak;U. Nam;M. Moon;J. Cheon
S. G. Lee;J. Bak;U. Nam;M. Moon;J. Cheon
中科院分区:
其他
文献类型:
--
作者:
S. G. Lee;J. Bak;U. Nam;M. Moon;J. Cheon

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利用分段式二维位置灵敏多丝正比计数管,研制了一台用于KSTAR托卡马克装置的X射线成像晶体谱仪。KSTAR托卡马克的XICS提供径向离子和电子温度分布、环形等离子体旋转速度和电离平衡的时间分辨测量。采用具有延迟线读出和支持电子器件的分段2D探测器来提高光子计数率能力。本文介绍了KSTAR托卡马克装置XICS的研制现状和分段式二维探测器样机的首次性能测试结果。
An advanced x-ray imaging crystal spectrometer (XICS) for KSTAR tokamak has been developed by utilizing a segmented two dimensional (2D) position-sensitive multiwire proportional counter. The XICS for the KSTAR tokamak provides time-resolved measurements of the radial ion and electron temperature profiles, toroidal plasma rotation velocity, and ionization equilibrium. The segmented 2D detector with delay-line readout and supporting electronics has been adopted to improve the photon count rate capability. The current fabrication status of the XICS for the KSTAR tokamak and the first performance test results of the prototype segmented 2D detector are presented.