Development of advanced x-ray imaging crystal spectrometer utilizing a large area segmented proportional counter for KSTAR.
Development of advanced x-ray imaging crystal spectrometer utilizing a large area segmented proportional counter for KSTAR.
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DOI:
10.1063/1.2749441
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发表时间:
2007-06
期刊:
影响因子:
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通讯作者:
S. G. Lee;J. Bak;U. Nam;M. Moon;J. Cheon
中科院分区:
文献类型:
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作者:
S. G. Lee;J. Bak;U. Nam;M. Moon;J. Cheon
An advanced x-ray imaging crystal spectrometer (XICS) for KSTAR tokamak has been developed by utilizing a segmented two dimensional (2D) position-sensitive multiwire proportional counter. The XICS for the KSTAR tokamak provides time-resolved measurements of the radial ion and electron temperature profiles, toroidal plasma rotation velocity, and ionization equilibrium. The segmented 2D detector with delay-line readout and supporting electronics has been adopted to improve the photon count rate capability. The current fabrication status of the XICS for the KSTAR tokamak and the first performance test results of the prototype segmented 2D detector are presented.