Magnetic and recording characteristics of Cr, Ta, W and Zr pre-coated glass disks
Magnetic and recording characteristics of Cr, Ta, W and Zr pre-coated glass disks
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Cr、Ta、W 和 Zr 预镀玻璃盘的磁性和记录特性
DOI：
10.1109/20.490107
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发表时间：
1995
期刊：
影响因子：
--
通讯作者：
K. Furusawa
中科院分区：
文献类型：
--
作者：
Kataoka Hiroyuki;T. Kanbe;H. Kashiwase;E. Fujita;Y. Yahisa;K. Furusawa
本文研究了镀在Cr、Ta、W和Zr预涂玻璃盘上的CoCrPt/CrTi介质的磁特性和记录特性。在Ta和Zr上获得高S*。在Ta上获得了最大的输出信号和最低的直流擦除和记录噪声。锆预涂光盘上的记录噪声是第二低的。当预涂层厚度增加时，Ta上的H/sub c/增加了700 Oe，但Zr上的H/sub c/增加很小。另一方面，在Ta上，DC擦除噪声保持恒定并且记录噪声降低，并且在Zr上，DC擦除噪声和记录噪声都略微增加。的/spl δ/M测量表明，Ta厚度的增加导致CoCrPt晶体之间的磁相互作用的减少。在Ta上观察到强的Co（110）/Cr（100）取向，并且在Ta、Zr预涂覆介质之间没有观察到晶粒尺寸的主要差异。Ta预涂层上的低DC擦除噪声特性将主要归因于强的面内c轴取向。
Magnetic and recording characteristics of CoCrPt/CrTi media which are deposited on Cr, Ta, W and Zr pre-coated glass disks, are examined. High S* was obtained on Ta and Zr. The largest output signal and the lowest DC-erase and recording noise were obtained on Ta. The recording noise on Zr pre-coated disk was second lowest. When the pre-coating thickness is increased, H/sub c/ on Ta increased by 700 Oe but the H/sub c/ increase on Zr was small. On the other hand, the DC-erase noise stayed constant and the recording noise decreased on Ta and both DC-erase noise and recording noise slightly increased on Zr. The /spl delta/M measurement revealed that the increase of Ta thickness caused the reduction of magnetic interaction between CoCrPt crystals. Strong Co(110)/Cr(100) orientation was observed on Ta and no major difference in crystal grain size was observed between Ta, Zr pre-coated media. The low DC-erase noise characteristics on Ta pre-coating would be attributed mainly to strong in-plane c-axis orientation.