Calibration of friction force signals in atomic force microscopy in liquid media.
Calibration of friction force signals in atomic force microscopy in liquid media.
复制标题
液体介质中原子力显微镜摩擦力信号的校准。
DOI：
10.1021/la070174v
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发表时间：
2007
期刊：
影响因子：
--
通讯作者：
G. Vancso
中科院分区：
文献类型：
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作者：
E. Tocha;Jing Song;H. Schönherr;G. Vancso
与空气中的测量相比，液体介质中原子力显微镜（AFM）摩擦力测量的校准因子相差25-74%。即使它明显更精确，使用通用校准样品的改进的楔形校准方法也与所有其他广泛应用的方法一样，具有以下缺点：对于最常见的液体池设计，在空气中获得的摩擦力校准因子不能用于液体中的测量。激光折射的效果和校准因子对成像介质的折射率的依赖性被定量地捕获在一个简单的模型中，该模型允许人们方便地重新缩放在空气中获得的横向光电二极管灵敏度的值。因此，一个简单的，但精确的横向力校准现在也是可行的AFM在液体中。
The calibration factors for atomic force microscopy (AFM) friction force measurements in liquid media are shown to be different by 25-74% compared to measurements in air. Even though it is significantly more precise, the improved wedge calibration method using a universal calibration specimen suffers, as all other widely applied methods, from the drawback that friction force calibration factors acquired in air cannot be used for measurements in liquids for the most common liquid cell designs. The effect of laser light refraction and the dependence of the calibration factors on the refractive index of the imaging medium is captured quantitatively in a simple model that allows one to conveniently rescale the values of lateral photodiode sensitivity obtained in air. Hence a simple, yet precise calibration of lateral forces is now also feasible for AFM in liquids.