TOF‐SIMS matrix effects in mixed organic layers in Ar cluster ion depth profiles
TOF‐SIMS matrix effects in mixed organic layers in Ar cluster ion depth profiles
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Ar 簇离子深度剖面中混合有机层的 TOF-SIMS 矩阵效应
DOI：
10.1002/sia.6214
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发表时间：
2017
影响因子：
1.7
通讯作者：
Tomoko Kawashima
中科院分区：
文献类型：
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作者：
Kazuma Takahashi;S. Aoyagi;Tomoko Kawashima
矩阵效应对于使用飞行时间二次离子质谱（ToF - SIMS）进行定量分析、深度分析和成像至关重要。在这种分析之前，通常很难预测共存的材料如何相互影响。然而，为了在样品中假设适当数量的目标材料，需要减少基体效应。首先，利用ToF - SIMS观察了基质对不同类型有机混合样品的影响，包括由Irganox 1010和Irganox 1098组成的样品（MMK样品）和由Irganox 1010和Fmoc -五氟- L -苯丙氨酸组成的样品（MMF样品），并评估了基质对同一样品的二次离子极性的依赖性。接下来，将Shard等人提出的ToF - SIMS矩阵效应的校正方法应用于正二次离子结果与负二次离子结果的比较。两种样品中正离子数据的基质效应与负离子数据的基质效应不同。矩阵效应校正方法对正、负深度剖面均有效。版权所有©2017 John Wiley & Sons， Ltd
Matrix effects are crucial for analyses using time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) in terms of quantitative analysis, depth profiling and imaging. It is often difficult to predict how co‐existing materials will influence each other before such analysis. However, matrix effects need to be curtailed in order to assume the appropriate amount of a target material in a sample. First, matrix effects on different types of organic mixed samples, including a sample composed of Irganox 1010 and Irganox 1098 (MMK sample) and another composed of Irganox 1010 and Fmoc‐pentafluoro‐L‐phenylalanine (MMF sample), were observed utilizing ToF‐SIMS and the dependence of the secondary ion polarity of the matrix effects on the same sample was evaluated. Next, the correction method for the ToF‐SIMS matrix effects proposed by Shard et al. was applied to a comparison of the positive secondary ion results to the negative ones. The matrix effects on the positive ion data in both samples were different from those on the negative ion data. The matrix effect correction method worked effectively on both the negative and positive depth profiles. Copyright © 2017 John Wiley & Sons, Ltd.