X-ray Moiré Topography of Lattice Defects in Quartz
X-ray Moiré Topography of Lattice Defects in Quartz
复制标题
石英晶格缺陷的 X 射线莫尔纹形貌
作者：
A. R. Lang
X 射线莫尔形貌图显示了两个晶体晶格之间的不匹配图。根据莫尔条纹图案，位错和其他晶体缺陷引起的晶格位移可以测量到埃单位的一小部分。
The X-ray moiré topograph displays a map of mismatch between the lattices of two crystals. From moiré fringe patterns the lattice displacements due to dislocations and other crystal defects can be measured to a fraction of an Ångstrom unit.