Detection efficiency in total internal reflection fluorescence microscopy
Detection efficiency in total internal reflection fluorescence microscopy
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DOI：
10.1364/oe.16.008519
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发表时间：
2008-06-09
期刊：
影响因子：
3.8
通讯作者：
Lasser, Theo
中科院分区：
文献类型：
--
作者：
Leutenegger, Marcel;Lasser, Theo
我们提出了一个快速和灵活的框架，准确计算各向同性介质中的荧光发射的检测效率，以及在附近的电介质或金属界面。该框架考虑了发射荧光的偶极特性，并通过考虑荧光团辐射的总功率来产生绝对检测效率。这种分析被证明是有用的定量测量，即在玻璃-水界面处的荧光检测的全内反射荧光显微镜在一个epi和trans-illumination配置。(C)2008年美国光学学会。
We present a rapid and flexible framework for the accurate calculation of the detection efficiency of fluorescence emission in isotropic media as well as in the vicinity of dielectric or metallic interfaces. The framework accounts for the dipole characteristics of the emitted fluorescence and yields the absolute detection efficiency by taking into account the total power radiated by the fluorophore. This analysis proved to be useful for quantitative measurements, i.e. the fluorescence detection at a glass - water interface for total internal reflection fluorescence microscopy in an epi- and a trans-illumination configuration. (C) 2008 Optical Society of America.