CTEM versus STEM versus HVEM: Evaluation of the three‐dimensional morphology of arsenic inclusions
CTEM versus STEM versus HVEM: Evaluation of the three‐dimensional morphology of arsenic inclusions
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CTEM 与 STEM 与 HVEM：砷夹杂物三维形态的评估
DOI：
10.1002/jemt.1060020606
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发表时间：
1985
期刊：
影响因子：
--
通讯作者：
E. M. Sorensen
中科院分区：
文献类型：
--
作者：
R. Ramirez;E. M. Sorensen
电子致密的砷夹杂物出现在细胞核的实质肝细胞从鱼暴露于砷酸盐，但在相同的条件下暴露的鱼缺乏砷的解决方案是不存在的。这些夹杂物的图像进行了比较，使用传统的透射电子显微镜（CTEM），扫描透射电子显微镜（STEM），高压电子显微镜（HVEM）。使用这些方法中的每一种来检查来自相同个体夹杂物的立体对，以提供对其三维组织的更完整的理解，并评估每种技术在类似电子致密结构的研究中的相对优点。
使用三种类型的仪器获得了可比较的结果。尽管HVEM是用于分析这种高电子密度结构的三维图像的首选技术，但STEM被证明是用于HVEM制备中样品的选择和一般评价的良好替代技术。
Electron-dense arsenic inclusions appeared in the nucleus of parenchymal hepatocytes from fish exposed to arsenate, but were absent in fish exposed under identical conditions to solutions lacking arsenic. Images of these inclusions were compared using conventional transmission electron microscopy (CTEM), scanning transmission electron microscopy (STEM), and high-voltage electron microscopy (HVEM). Stereo pairs from the same individual inclusions were examined using each of these methods to provide a more complete understanding of their three-dimensional organization and to evaluate the relative merits of each technique in the study of similar electron-dense structures.
Comparable results were obtained with the three types of instrumentation. Although HVEM is the technique of choice for the analysis of three-dimensional images of such high electron-dense structures, STEM proved to be a good alternate technique for the selection and general evaluation of samples in preparation for HVEM.