Modeling of LC-shunted intrinsic Josephson junctions in high-Tc superconductors
Modeling of LC-shunted intrinsic Josephson junctions in high-Tc superconductors
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DOI：
10.1088/1361-6668/30/2/024006
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发表时间：
2017-02
影响因子：
3.6
通讯作者：
Y. Shukrinov;I. Rahmonov;K. Kulikov;A. E. Botha;A. Plecenik;P. Seidel;W. Nawrocki
中科院分区：
文献类型：
--
作者：
Y. Shukrinov;I. Rahmonov;K. Kulikov;A. E. Botha;A. Plecenik;P. Seidel;W. Nawrocki
研究了由 LC 元件（L 电感、C 电容）分流的本征约瑟夫森结模型中的谐振现象。当约瑟夫森频率接近谐振电路频率时，详细研究了相位动态和 IV 特性。演示了在对应于谐振电路支路的偏置电流区间内通过激发纵向等离子体波来实现参量谐振。研究发现，堆的总电压和并联电容器两端测量的电压的时间依赖性反映了超导层的充电，这种现象可能可用作实验检测此类充电的手段。因此，基于电压动力学，提出了一种确定耦合约瑟夫森结超导层充电的新方法。给出了外部电磁辐射对 IV 特性和充电时间依赖性影响的演示和讨论。在某些参数范围内，辐射会在超导层内的电荷时间振荡中引起有趣的新型时间分裂。
Resonance phenomena in a model of intrinsic Josephson junctions shunted by LC-elements (L-inductance, C-capacitance) are studied. The phase dynamics and IV-characteristics are investigated in detail when the Josephson frequency approaches the frequency of the resonance circuit. A realization of parametric resonance through the excitation of a longitudinal plasma wave, within the bias current interval corresponding to the resonance circuit branch, is demonstrated. It is found that the temporal dependence of the total voltage of the stack, and the voltage measured across the shunt capacitor, reflect the charging of superconducting layers, a phenomenon which might be useful as a means of detecting such charging experimentally. Thus, based on the voltage dynamics, a novel method for the determination of charging in the superconducting layers of coupled Josephson junctions is proposed. A demonstration and discussion of the influence of external electromagnetic radiation on the IV-characteristics and charge-time dependence is given. Over certain parameter ranges the radiation causes an interesting new type of temporal splitting in the charge-time oscillations within the superconducting layers.