Creating a Backscattering Side Channel to Enable Detection of Dormant Hardware Trojans

Creating a Backscattering Side Channel to Enable Detection of Dormant Hardware Trojans
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DOI:
10.1109/tvlsi.2019.2906547
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发表时间:
2019-04
影响因子:
2.8
通讯作者:
Luong N. Nguyen;Chia-Lin Cheng;Milos Prvulović;A. Zajić
Luong N. Nguyen;Chia-Lin Cheng;Milos Prvulović;A. Zajić
中科院分区:
工程技术2区
文献类型:
--
作者:
Luong N. Nguyen;Chia-Lin Cheng;Milos Prvulović;A. Zajić

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本文描述了一种新的物理侧信道,即,通过向集成电路(IC)传输信号而产生的反向散射侧信道,其中由片上切换活动引起的内部阻抗变化调制从IC反向散射(反射)的信号。为了演示如何使用这种新的侧通道来检测电路阻抗的微小变化,我们提出了一种新的方法,用于从芯片外部非破坏性地检测硬件木马(HT)。我们通过实验确认,使用一个物理实例进行训练和九个其他物理实例进行测试,新的侧通道,当与HT检测方法相结合时,允许在100%的HT折磨测量中检测休眠HT,同时在HT自由测量中不产生误报。此外,还进行了额外的实验,将基于反向散射的检测与使用传统的基于电磁发射的侧通道的检测进行比较。这些结果表明,基于后向散射的检测优于EM侧信道,确认休眠的HT比已被激活的HT更难以检测,并显示了如何通过改变HT的大小和在IC上的物理位置来影响检测。
This paper describes a new physical side channel, i.e., the backscattering side channel, created by transmitting a signal toward the integrated circuits (ICs), where the internal impedance changes caused by on-chip switching activity modulate the signal that is backscattered (reflected) from the IC. To demonstrate how this new side channel can be used to detect small changes in circuit impedances, we propose a new method for nondestructively detecting hardware Trojans (HTs) from outside the chip. We experimentally confirm, using measurements on one physical instance for training and nine other physical instances for testing, that the new side channel, when combined with an HT detection method, allows detection of a dormant HT in 100% of the HT-afflicted measurements for a number of different HTs while producing no false positives in HT-free measurements. Furthermore, additional experiments are conducted to compare the backscattering-based detection to one that uses the traditional EM-emanation-based side channel. These results show that backscattering-based detection outperforms the EM side channel, confirm that dormant HTs are much more difficult for detection than HTs that have been activated, and show how detection is affected by changing the HT’s size and physical location on the IC.