Sources of Internal Scattering of Electrons in a Cylindrical Mirror Analyser (CMA)
Sources of Internal Scattering of Electrons in a Cylindrical Mirror Analyser (CMA)
复制标题
柱面镜分析仪 (CMA) 中电子内部散射的来源
DOI:
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发表时间:
1996
期刊:
影响因子:
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通讯作者:
T. A. E. Bakush
中科院分区:
文献类型:
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作者:
M. Gomati;T. A. E. Bakush
A number of possible sources of internal scattering of electrons in a single-pass Varian cylindrical mirror analyser (CMA) have been identified and their relative contributions to the electron spectral background evaluated. These sources include : the inner surfaces of the outer cylinder ; the input and output apertures of the inner cylinder ; the field trimmers between the two cylinders ; the walls of the exit aperture in front of the electron detector ; the outer surfaces of the inner cylinder. A theory/experiment comparison of the above sources has verified that the two most significant of these are the walls of the exit aperture and the field trimmers. The other sources contribute only negligibly to the total signal of internally scattered electrons. Simple modifications of the spectrometer and its detector show a large reduction in the internal scattering signal. A simple experimental measurement for determining the relative contribution of the various internal scattering sources is suggested. This measurement is recommended instead of the commonly used peak-to-background ratios as a diagnostic tool for detecting and evaluating all the above-mentioned sources of internal scattering of electrons in a CMA.