Test of YBCO thin films based fault current limiters with a newly designed meander
Test of YBCO thin films based fault current limiters with a newly designed meander
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基于 YBCO 薄膜的故障限流器的新设计曲流测试
DOI:
10.1109/tasc.2005.849434
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发表时间:
2005
影响因子:
1.8
通讯作者:
Y. Fischer
中科院分区:
文献类型:
--
作者:
L. Antognazza;M. Decroux;M. Therasse;M. Abplanalp;Y. Fischer
To facilitate the up scaling of thin film based fault current limiters (FCL), a complete control of the localization of the dissipated power is needed. This control can be achieved by a new design where constrictions, which are regularly located along the YBCO/Au meander, have the aim of localizing and homogenizing this dissipated power at the beginning of a short circuit. To minimize the initial power peak, the resistivity of the constrictions has to be as small as possible whereas the resistivity of the connecting paths should be increased in order to lower the long-term power. We have tested these expected improvements on 5 kW (340 V, 16 A) FCL, on 2'' wafers, in AC conditions. The observed behavior of the FCL during short circuits, initiated at fault angles, confirm that the dissipated power is minimized and distributed, in a controlled way, along the meander. Finally we present measurements of the self-restoring time of the FCL and test on a 10 kW FCL made of two wafers connected in parallel.