Test of YBCO thin films based fault current limiters with a newly designed meander

Test of YBCO thin films based fault current limiters with a newly designed meander
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基于 YBCO 薄膜的故障限流器的新设计曲流测试

DOI:
10.1109/tasc.2005.849434
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发表时间:
2005
影响因子:
1.8
通讯作者:
Y. Fischer
Y. Fischer
中科院分区:
物理与天体物理3区
文献类型:
--
作者:
L. Antognazza;M. Decroux;M. Therasse;M. Abplanalp;Y. Fischer

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为了促进基于薄膜的故障电流限制器(FCL)的扩大规模,需要对耗散功率的局部化进行完全控制。这种控制可以通过一种新的设计来实现,其中沿着 YBCO/Au 曲流定期布置的收缩部分的目的是在短路开始时局部化和均匀化这种耗散功率。为了最小化初始功率峰值,收缩部的电阻率必须尽可能小,而连接路径的电阻率应增加以降低长期功率。我们已在交流条件下在 2 英寸晶圆上的 5 kW(340 V,16 A)FCL 上测试了这些预期的改进。在故障角引发的短路期间观察到的 FCL 行为证实,耗散功率已最小化,并以受控方式沿着曲折分布。最后,我们展示了 FCL 自恢复时间的测量结果,并在由两个并联晶圆制成的 10 kW FCL 上进行了测试。
To facilitate the up scaling of thin film based fault current limiters (FCL), a complete control of the localization of the dissipated power is needed. This control can be achieved by a new design where constrictions, which are regularly located along the YBCO/Au meander, have the aim of localizing and homogenizing this dissipated power at the beginning of a short circuit. To minimize the initial power peak, the resistivity of the constrictions has to be as small as possible whereas the resistivity of the connecting paths should be increased in order to lower the long-term power. We have tested these expected improvements on 5 kW (340 V, 16 A) FCL, on 2'' wafers, in AC conditions. The observed behavior of the FCL during short circuits, initiated at fault angles, confirm that the dissipated power is minimized and distributed, in a controlled way, along the meander. Finally we present measurements of the self-restoring time of the FCL and test on a 10 kW FCL made of two wafers connected in parallel.