Ionization dynamics of Xe nanoplasma formation studied with XUV fluorescence spectroscopy

Ionization dynamics of Xe nanoplasma formation studied with XUV fluorescence spectroscopy
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用 XUV 荧光光谱研究 Xe 纳米等离子体形成的电离动力学

DOI:
10.1088/0953-4075/48/18/184002
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发表时间:
2015
期刊:
Journal of Physics B: Atomic, Molecular and Optical Physics
影响因子:
--
通讯作者:
A. Przystawik
A. Przystawik
中科院分区:
--
文献类型:
--
作者:
A. Przystawik

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来自短波长自由电子激光器的强脉冲在飞秒内将氙纳米颗粒转变为高能量密度的纳米等离子体。最近,在等离子体演化的初始阶段期间多电荷氙离子的产生已经通过能量分辨XUV荧光检测作为团簇大小和团簇组成的函数进行了研究[1]。本文详细分析了4d电子壳层在2× 10 12 - 2.45× 10 15 W cm-2共振激发后的辐射跃迁。对电荷态特定荧光产额与自由电子激光功率密度的函数关系的评估表明,电离势降低、电子碰撞激发、电离和能量重新分配等等离子体效应决定了氙团簇中激光诱导的非平衡动力学。
Intense pulses from a short wavelength free-electron laser turn xenon nanoparticles into a high energy density nanoplasma within femtoseconds. Recently, the generation of multiply charged xenon ions during the initial phase of plasma evolution has been studied by energy-resolved XUV fluorescence detection as a function of cluster size and cluster composition [1]. In the present contribution we give a detailed analysis of the corresponding radiative transitions after resonant excitation of the 4d electron shell at intensities of 2× 10 12− 2.45× 10 15 W cm− 2. The evaluation of charge-state specific fluorescence yields as a function of FEL power density demonstrates that plasma effects such as ionization potential lowering, electron impact excitation, ionization, and energy redistribution govern the laser-induced non-equilibrium dynamics in xenon clusters.
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影响因子: 16.6
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