Electromagnetic diffraction of light focused through a planar interface between materials of mismatched refractive indices: structure of the electromagnetic field. I
Electromagnetic diffraction of light focused through a planar interface between materials of mismatched refractive indices: structure of the electromagnetic field. I
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DOI：
10.1364/josaa.12.002136
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发表时间：
1995-10
影响因子：
1.9
通讯作者：
P. Török;P. Varga;A. Konkol;G. Booker
中科院分区：
文献类型：
--
作者：
P. Török;P. Varga;A. Konkol;G. Booker
我们考虑了当光线通过折射率不匹配的材料之间的平面界面时，光被透镜聚焦时产生的电磁衍射，聚焦产生球差。通过由Torok等人先前为这个问题开发的严格的矢量电磁处理。[J.opt.SoC。上午好。A12,325(1995)]，数值计算了空气-玻璃和空气-硅界面的时间平均电能密度分布随透镜数值孔径和探测深度的变化。对于较小的数值孔径和探头深度，Strehl强度、横向和轴向尺寸以及探头的轴向位置是正则函数，而对于较大的数值孔径和探头深度，Strehl强度、横向和轴向尺寸以及探头的轴向位置是不规则函数。给出了对这些现象的解释，也解释了以前共焦显微镜的一些实验结果。
We consider the electromagnetic diffraction occurring when light is focused by a lens without spherical aberration through a planar interface between materials of mismatched refractive indices, which focusing produces spherical aberration. By means of a rigorous vectorial electromagnetic treatment developed previously for this problem by Torok et al. [ J. Opt. Soc. Am. A12, 325 ( 1995)], the time-averaged electric energy density distributions in the region of the focused probe are numerically evaluated for air–glass and air–silicon interfaces as functions of lens numerical aperture and probe depth. Strehl intensity, lateral and axial sizes, and axial location of the probe are shown to be regular functions for low numerical apertures and probe depths but irregular functions for high numerical apertures and probe depths. An explanation to account for these occurrences is presented that also explains some previous experimental results of confocal microscopy.