Mass transport through dislocation network in solid He4
Mass transport through dislocation network in solid He4
复制标题
固体 He4 中通过位错网络的质量传输
DOI：
10.1103/physrevb.99.140502
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发表时间：
2019
影响因子：
3.7
通讯作者：
Chan, Moses H.
中科院分区：
文献类型：
--
作者：
Shin, Jaeho;Chan, Moses H.
我们研究了原子通过夹在两根超流体引线之间的2.5毫米厚的固体样品和五种不同的定制样品细胞的传输。在固体样品中心有屏障的细胞和充满二氧化硅气凝胶的细胞中进行测量，建立了观察到的质量流与固体样品中的位错网络之间的因果关系。将这些细胞的结果与先前对厚度为2 cm的固体样品的测量结果进行比较，发现质量流率随固体厚度呈对数递减。有趣的是，在低温下，质量流同时表现出超流体和玻色子卢廷格液体的特征。
We studied the transport ofatoms through 2.5-mm-thick solidsamples sandwiched between two superfluid leads with five different tailor-made sample cells. Measurements in a cell with a barrier at the center of the solid samples and in a cell filled with silica aerogel establish the causal relation between the observed mass flow and the dislocation network in the solid sample. Comparing the results from these cells and prior measurements on solid samples with thicknesses of 2 cm andreveals that the mass flow rate decreases logarithmically with the thickness of the solid. Interestingly, the mass flow exhibits both superfluid and bosonic Luttinger liquid characteristics at low temperature.