Electron energy-loss near-edge structures of 3d transition metal oxides recorded at high-energy resolution
Electron energy-loss near-edge structures of 3d transition metal oxides recorded at high-energy resolution
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DOI：
10.1016/s0304-3991(03)00109-8
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发表时间：
2003-09-01
期刊：
影响因子：
2.2
通讯作者：
Hofer, F
中科院分区：
文献类型：
--
作者：
Mitterbauer, C;Kothleitner, G;Hofer, F
用一台配有单色器和高分辨成象滤光片的透射电子显微镜研究了过渡金属氧化物中金属L-2、L-3和O K边的近边精细结构。该系统能够记录EELS光谱的能量分辨率为0.1 eV，从而提供了新的近边缘的精细结构的细节，这是以前无法观察到的EELS在传统的TEM仪器。用新系统测量了氧化钛（TiO 2）、氧化钒（V2 O 5）、氧化铬（Cr2 O3）、氧化铁（Fe 2 O3）、氧化钴（CoO）和氧化镍（NiO）等定义明确的氧化物的EELS光谱。这些光谱与EELS数据从传统的显微镜和主要的光谱特征进行了比较解释。此外，单色TEM的使用进行了讨论，鉴于K和L-2，L-3边缘的自然线宽。(C)2003 Elsevier Science B. V.保留所有权利。
Near-edge fine structures of the metal L-2,L-3 and O K-edges in transition metal-oxides have been studied with a transmission electron microscope equipped with a monochromator and a high-resolution imaging filter. This system enables the recording of EELS spectra with an energy resolution of 0.1 eV thus providing new near-edge fine structure details which could not be observed previously by EELS in conventional TEM instruments. EELS-spectra from well-defined oxides like titanium oxide (TiO2), vanadium oxide (V2O5), chromium oxide (Cr2O3), iron oxide (Fe2O3), cobalt oxide (CoO) and nickel oxide (NiO) have been measured with the new system. These spectra are compared with EELS data obtained from a conventional microscope and the main spectral features are interpreted. Additionally, the use of monochromised TEMs is discussed in view of the natural line widths of K and L-2,L-3 edges. (C) 2003 Elsevier Science B.V. All rights reserved.