Analytical method for the measurement of the electrostatic force and the contact potential difference excluding the effect of the Casimir force with a conventional atomic force microscope

Analytical method for the measurement of the electrostatic force and the contact potential difference excluding the effect of the Casimir force with a conventional atomic force microscope
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用传统原子力显微镜测量排除卡西米尔力影响的静电力和接触电位差的分析方法

DOI:
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发表时间:
2019
影响因子:
1.5
通讯作者:
Naoki Yoshida and Kazuhisa Sueoka
Naoki Yoshida and Kazuhisa Sueoka
中科院分区:
物理与天体物理4区
文献类型:
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作者:
Naoki Yoshida and Kazuhisa Sueoka

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