Damege of Flexible Electronic Line Printed with Ag Nanoparticle Ink Due to High-Current Density

Damege of Flexible Electronic Line Printed with Ag Nanoparticle Ink Due to High-Current Density
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高电流密度对银纳米粒子油墨印刷柔性电子线路的损伤

DOI：
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发表时间：
2019
期刊：
Proc. ASME 2019 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems
影响因子：
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通讯作者：
Kazuhiro Fujisaki
Kazuhiro Fujisaki
中科院分区：
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文献类型：
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作者：
Daiki Saito;Kazuhiko Sasagawa;Takeshi Moriwaki;Kazuhiro Fujisaki

文献摘要

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