Etching of Cr tips for scanning tunneling microscopy of cleavable oxides.
Etching of Cr tips for scanning tunneling microscopy of cleavable oxides.
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用于可裂解氧化物扫描隧道显微镜的 Cr 尖端蚀刻。
DOI：
10.1063/1.4976567
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发表时间：
2013
期刊：
影响因子：
--
通讯作者：
J. Hoffman
中科院分区：
文献类型：
--
作者：
Dennis Huang;Stephen Liu;I. Zeljkovic;J. Mitchell;J. Hoffman
我们报告了一个详细的三步路线图的自旋极化扫描隧道显微镜的散装铬提示的制造和表征。我们的策略独特地避免了清洁表面或薄膜的超高真空制备需求。首先，我们证明了非原位电化学蚀刻参数的作用，铬尖顶点几何形状，使用扫描电子显微镜照片超过70蚀刻提示。第二，我们描述的层状反铁磁体La1.4Sr1.6Mn2O7的原位解理表面的适用性，以评估的Cr尖端的自旋特性，取代超高真空制备的测试样品，已在以前的研究中使用。第三，我们概述了一个统计算法，可以有效地描绘紧密间隔或不规则的解理台阶边缘，以最大限度地提高台阶高度和自旋极化测量的准确性。
We report a detailed three-step roadmap for the fabrication and characterization of bulk Cr tips for spin-polarized scanning tunneling microscopy. Our strategy uniquely circumvents the need for ultra-high vacuum preparation of clean surfaces or films. First, we demonstrate the role of ex situ electrochemical etch parameters on Cr tip apex geometry, using scanning electron micrographs of over 70 etched tips. Second, we describe the suitability of the in situ cleaved surface of the layered antiferromagnet La1.4Sr1.6Mn2O7 to evaluate the spin characteristics of the Cr tip, replacing the ultra-high vacuum-prepared test samples that have been used in prior studies. Third, we outline a statistical algorithm that can effectively delineate closely spaced or irregular cleaved step edges, to maximize the accuracy of step height and spin-polarization measurements.
影响因子：
56.9
作者：
Romming, Niklas;Hanneken, Christian;Wiesendanger, Roland
通讯作者：
Wiesendanger, Roland