Contributions of scanning probe microscopy and spectroscopy to the investigation and fabrication of nanometer‐scale structures*
Contributions of scanning probe microscopy and spectroscopy to the investigation and fabrication of nanometer‐scale structures*
复制标题
扫描探针显微镜和光谱学对纳米级结构研究和制造的贡献*
DOI：
10.1116/1.587032
复制
发表时间：
1994
期刊：
影响因子：
--
通讯作者：
R. Wiesendanger
中科院分区：
文献类型：
--
作者：
R. Wiesendanger
Scanning tunneling microscopy and related local probe methods have led to a novel perception of nanometer‐ and atomic‐scale structures and processes. Since the information is obtained directly in real space, the scanning probe techniques offer significant advantages for the investigation of nonperiodic structures at solid surfaces compared with diffraction techniques. Additionally, local probe methods allow the study of a large variety of physical properties of nanometer‐scale structures down to atomic resolution and even became useful for the fabrication of artificial nanometer‐scale structures. On the other hand, a large number of unresolved scientific and technological issues still remains. In this review, the focus is on two basic questions: what actually has been achieved and which fundamental physics issues need to be addressed further. The discussion will be restricted to topics in solid state physics.
