A robust sequential approach for the detection of defective pixels in an image sensor
A robust sequential approach for the detection of defective pixels in an image sensor
复制标题
用于检测图像传感器中缺陷像素的稳健顺序方法
DOI：
10.1109/icassp.1999.758382
复制
发表时间：
1999
期刊：
影响因子：
--
通讯作者：
T. Acharya
中科院分区：
文献类型：
--
作者：
Yap;T. Acharya
大型图像传感器通常包含相同的缺陷。缺陷是具有异常光响应性的像素。因此，它们经常产生与其相邻像素输出不同的输出，并严重降低所捕获图像的视觉质量。然而，生产没有缺陷的传感器来渲染图像在经济上是不可行的。图像传感器中通常允许有限数量的缺陷，只要有缺陷的输出可以用后信号处理技术纠正即可。在本文中，我们提出了一种稳健的序贯方法，从传感器捕获的图像序列中检测传感器缺陷。利用这种方法，在传感器设备中不需要额外的非易失性存储器来存储传感器缺陷的位置。此外，可以在计算机主机中高效地执行图像缺陷输出的检测和校正。文中给出了该方法的实验结果。
Large image sensors usually contain same defects. Defects are pixels with abnormal photo-responsibility. As a result they often generate outputs different from their adjacent pixel outputs and seriously degrade the visual quality of the captured images. However, it is not economically feasible to produce sensors with no defects for rendering images. A limited number of defects are usually allowed in an image sensor as long as the defective outputs can be corrected with post signal processing techniques. In this paper we present a robust sequential approach for detecting sensor defects from a sequence of images captured by the sensor. With this approach no extra non-volatile memory is required in the sensor device to store the locations of sensor defects. In addition, the detection and correction of image defective outputs can be performed efficiently in a computer host. Experimental results of this approach are reported in the paper.