Magnetotransport properties of CrO2 films down to single-grain sizes
Magnetotransport properties of CrO2 films down to single-grain sizes
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小至单晶粒尺寸的 CrO2 薄膜的磁输运特性
DOI：
10.1063/1.1555987
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发表时间：
2003
影响因子：
3.2
通讯作者：
S. Liou
中科院分区：
文献类型：
--
作者：
L. Yuan;Y. Ovchenkov;A. Sokolov;C. Yang;B. Doudin;S. Liou
已经研究了小至单晶粒尺寸的 CrO2 薄膜的磁输运特性。使用高压池沉积在 TiO2 (100) 基底上的高晶粒取向 CrO2 (100) 薄膜的磁阻在 1.5–300 K 的温度范围和高达 6 T 的磁场中进行了测量。这些样品在低温下磁阻的差异与样品的残余电阻比 (RRR=R273 K/R4.2 K) 的值有关。在其中一些薄膜中观察到的负磁阻可能是由于 CrO2 晶体中的缺陷（无序）造成的。当用垂直于 c 轴的电流进行测量时，我们观察到 CrO2 样品中存在较大的正纵向磁阻。纵向磁阻值较大的本质可能与CrO2费米面的复杂构型有关。
The magnetotransport properties of CrO2 films down to single-grain sizes have been investigated. The magnetoresistance of highly grain oriented CrO2 (100) films, deposited onto TiO2 (100) substrates using a high pressure cell, has been measured in the temperature range of 1.5–300 K and in magnetic fields up to 6 T. The difference in the magnetoresistance at the low temperature of these samples is related to the value of the residual resistance ratio (RRR=R273 K/R4.2 K) of the samples. The negative magnetoresistance observed in some of these films is likely due to defects (disorder) in the CrO2 crystal. We observed a large positive longitudinal magnetoresistance in the CrO2 sample when it was measured with the current perpendicular to the c axis. The nature of the large value of the longitudinal magnetoresistance may be related to the complex configuration of the Fermi surface of CrO2.