CIDRE: an illumination-correction method for optical microscopy
CIDRE: an illumination-correction method for optical microscopy
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DOI：
10.1038/nmeth.3323
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发表时间：
2015-05-01
期刊：
影响因子：
48
通讯作者：
Horvath, Peter
中科院分区：
文献类型：
--
作者：
Smith, Kevin;Li, Yunpeng;Horvath, Peter
不均匀的光照会影响显微镜获取的每一幅图像。它经常被忽视，但它会给图像测量带来相当大的偏差。最可靠的校正方法需要特殊的参考图像，而回溯性替代方法不能完全模拟校正过程。我们的方法克服了大多数光学显微镜应用的这些问题，而不需要参考图像。
Uneven illumination affects every image acquired by a microscope. It is often overlooked, but it can introduce considerable bias to image measurements. The most reliable correction methods require special reference images, and retrospective alternatives do not fully model the correction process. Our approach overcomes these issues for most optical microscopy applications without the need for reference images.