Silicon isotope separation utilizing infrared multiphoton dissociation of Si2F6 irradiated with two-frequency CO2 laser lights
Silicon isotope separation utilizing infrared multiphoton dissociation of Si2F6 irradiated with two-frequency CO2 laser lights
复制标题
利用双频 CO2 激光照射 Si2F6 的红外多光子解离进行硅同位素分离
DOI:
10.1007/s00340-004-1642-z
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发表时间:
2004
期刊:
影响因子:
--
通讯作者:
S. Arai
中科院分区:
文献类型:
--
作者:
A. Yokoyama;H. Ohba;M. Hashimoto;K. Katsumata;H. Akagi;T. Ishii;A. Ohya;S. Arai
Silicon isotope separation has been performed utilizing the infrared multiphoton dissociation (IRMPD) of Si2F6irradiated with two-frequency CO2laser lights. The two-frequency excitation method improved the separation efficiency by keeping the high enrichment factors. For example, Si2F6with the28Si fraction of 99.4% was obtained at 40.0% dissociation of Si2F6after the simultaneous irradiation of 100 pulses with 966.23 cm-1photons (0.089 J/cm2) and 954.55 cm-1photons (0.92 J/cm2), while 1000 pulses were needed to obtain 99.0% of28Si at 27.2% dissociation in the case of single frequency irradiation at 954.55 cm-1(0.92 J/cm2). The single-step enrichment factors of29Si and30Si increased with increasing Si2F6pressure. The reason for this enhancement has been discussed in terms of the rotational and vibrational relaxations by collisions with ambient gases.