Pressure dependence of secondary NIR scintillation in Ar and Ar/CF/sub 4/
Pressure dependence of secondary NIR scintillation in Ar and Ar/CF/sub 4/
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Ar 和 Ar/CF/sub 4/ 中二次近红外闪烁的压力依赖性
DOI：
10.1109/23.940075
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发表时间：
2001
影响因子：
1.8
通讯作者：
A. Policarpo
中科院分区：
文献类型：
--
作者：
M. Fraga;C. C. Bueno;J. Gonçalves;F. Fraga;R. Marques;A. Policarpo
研究了在Ar/CF/sub 4/混合物中，CF/sub 4/浓度低于15%时，在可见光和近红外（NIR）区（400</spl λ/<1000 mm），每个电子发射的光子总数随电荷增益的变化。在一个均匀的场配置和结果进行测量，提出了低于100的电荷增益，在X射线激发下。对于电荷增益G/spl sim/4，获得每个漂移电子发射的最大光子数（对于Ar/sup +/2%CF/sub 4/和Ar+10%CF/sub 4/，分别为0.7和0.2 ph/e/sup -/）。分析了Ar/CF/sub 4/混合气体的光谱分布。研究了纯氩和Ar/CF/sub 4/混合气体在可见光和近红外区的二次光输出随压力（1-4 atm）的变化关系，并与约化电场E/P进行了比较。在电荷倍增阈值以上，当压力从1个大气压增加到2个大气压时，每个电子发射的光子的最大数量减少约1.5倍。
The variation with charge gain of the total number of photons emitted per electron, in the visible and near-infrared (NIR) regions (400</spl lambda/<1000 mm), in Ar/CF/sub 4/, mixtures, is investigated for CF/sub 4/ concentrations below 15%. Measurements were performed in a uniform field configuration and results are presented for charge gains below 100, under X-ray excitation. The maximum number of photons emitted per drifting electron (0.7 and 0.2 ph/e/sup -/ for Ar/sup +/ 2% CF/sub 4/ and Ar+10% CF/sub 4/, respectively) is obtained for a charge gain G/spl sim/4. The spectral distribution of the emitted light in Ar/CF/sub 4/ mixtures is also analyzed. The pressure dependence (1-4 atm) of the secondary light output, in the visible and near infrared regions is studied as a function of the reduced electric field E/P for pure argon and Ar/CF/sub 4/ mixtures. Above the charge multiplication threshold, the maximum number of photons emitted per electron decreases by a factor of about 1.5 when the pressure increases from 1 to 2 atms.