Microstructure and magnetic properties of CoPt-SiNx∕Ag thin films
Microstructure and magnetic properties of CoPt-SiNx∕Ag thin films
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CoPt-SiNx∕Ag薄膜的微观结构和磁性能
DOI：
10.1063/1.2832342
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发表时间：
2008
影响因子：
3.2
通讯作者：
S. C. Chen
中科院分区：
文献类型：
--
作者：
Y. H. Fang;P. Kuo;Pei;C. Kuo;G. Lin;S. C. Chen
在室温下，在不同厚度的银膜上溅射不同量的非晶态SiNx非磁性材料和磁性Co50Pt50合金，然后在不同温度下进行热处理。当Ag底层厚度为25 nm时，CoPT/Ag薄膜的面内垂直度(S∥)最小，约为0.35。CoPT/Ag(25 Nm)薄膜的面外正方形(S⊥)约为0.95，面外矫顽力(HC⊥)约为15kOe，饱和磁化强度(Ms)约为420emu/cm~3。对不同SiNx体积分数的CoPT-SiNx/Ag(25 Nm)薄膜的微观结构分析发现，当SiNx的体积分数从0%增加到50%时，CoPT的平均晶粒尺寸从80 nm左右减小到9 nm左右。(CoPT)50-(SiNx)50/Ag薄膜的S⊥约为0.5kOe，HC⊥约为7.5kOe，MS值约为200emu/cm~3。
Different amounts of amorphous SiNx nonmagnetic material and magnetic Co50Pt50 alloy were cosputtered on the different thicknesses of Ag films at room temperature then annealed at different temperatures. When the thickness of Ag underlayer is 25nm, the CoPt∕Ag film has a minimum in-plane squareness (S∥) which is about 0.35. The out-of-plane squareness (S⊥), out-of-plane coercivity (Hc⊥), and saturated magnetization (Ms) values of the CoPt∕Ag (25nm) film are about 0.95, 15kOe, and 420emu∕cm3, respectively. From the microstructure analysis of CoPt-SiNx∕Ag (25nm) films with different volume percent of SiNx content, it is found that the average grain size of CoPt decreases from about 80to9nm when the volume percent of SiNx is increased from 0% to 50%. The S⊥, Hc⊥, and Ms values of the (CoPt)50-(SiNx)50∕Ag films are about 0.5, 7.5kOe, and 200emu∕cm3, respectively.
影响因子：
2.1
作者：
Zhengang Zhang;Kyongha Kang;T. Suzuki
通讯作者：
Zhengang Zhang;Kyongha Kang;T. Suzuki