Evaluation of elemental and compound semiconductors for x-ray digital radiography
Evaluation of elemental and compound semiconductors for x-ray digital radiography
复制标题
用于 X 射线数字射线照相的元素和化合物半导体的评估
DOI：
10.1016/0168-9002(91)91028-t
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发表时间：
1991
影响因子：
1.4
通讯作者：
A. Stefanini
中科院分区：
文献类型：
--
作者：
W. Bencivelli;E. Bertolucci;U. Bottigli;A. Guerra;A. Messineo;W. Nelson;P. Randaccio;V. Rosso;P. Russo;A. Stefanini
我们提出了一个元素和化合物的固态晶体的性能可能用于X射线数字射线照相的比较研究。的通用EGS 4代码被用来模拟光子-电子输运的能量范围为20至60千电子伏。的效率和能量分辨率，作为X射线能量的函数，计算和相关的不同的物理特性的晶体考虑。
We present a comparative study of the performance of elemental and compound solid state crystals of possible use in X-raY digital radiography. The general purpose EGS4 code was used to simulate photon-electron transport in the energy range 20 to 60 keV. The efficiency and the energy resolution, as a function of X-ray energy, are calculated and correlated to the different physical characteristics of the crystals considered.