Imaging antiferromagnetic domains in nickel oxide thin films by optical birefringence effect
Imaging antiferromagnetic domains in nickel oxide thin films by optical birefringence effect
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通过光学双折射效应对氧化镍薄膜中的反铁磁畴进行成像
DOI：
10.1103/physrevb.100.134413
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发表时间：
2019
影响因子：
3.7
通讯作者：
Wu Yizheng
中科院分区：
文献类型：
--
作者：
Xu Jia;Zhou Chao;Jia Mengwen;Shi Dong;Liu Changqing;Chen Haoran;Chen Gong;Zhang Guanhua;Liang Yu;Li Junqin;Zhang Wei;Wu Yizheng
反铁磁体（AFM）的电探测和操纵的最新演示为强大的超快自旋电子器件开辟了新的机会。然而，由于缺乏在电场下的实时AFM畴成像技术，很难建立自旋输运行为和微观AFM畴态之间的联系。在这里，我们报告了一个显着的Voigt旋转高达60毫度在薄NiO（001）薄膜在室温下。这样大的Voigt旋转使我们能够直接观察AFM域薄膜NiO通过利用宽视场光学显微镜。进一步的补充XMLD-PEEM测量证实了Voigt对比度源于NiO AFM级。我们研究了在很宽的温度范围内的磁畴图案的演变，并与应用程序的外部磁场。与X射线光电子显微镜等大型设备技术相比，使用宽视场桌面光学成像方法可以直接访问单层AFM的域配置。
Recent demonstrations of electrical detection and manipulation of antiferromagnets (AFMs) have opened new opportunities towards robust and ultrafast spintronics devices. However, it is difficult to establish the connection between the spin-transport behavior and the microscopic AFM domain states due to the lack of the real-time AFM domain imaging technique under the electric field. Here we report a significant Voigt rotation up to 60 mdeg in thin NiO(001) films at room temperature. Such large Voigt rotation allows us to directly observe AFM domains in thin-film NiO by utilizing a wide-field optical microscope. Further complementary XMLD-PEEM measurement confirms that the Voigt contrast originates from the NiO AFM order. We examine the domain pattern evolution at a wide range of temperature and with the application of external magnetic field. Comparing to large-scale-facility techniques such as the X-ray photoemission electron microscopy, the use with a wide-field, tabletop optical imaging method enables straightforward access to domain configurations of single-layer AFMs.