Exploring the impact of functional test programs re-used for power-aware testing
Exploring the impact of functional test programs re-used for power-aware testing
复制标题
探索重新用于功耗感知测试的功能测试程序的影响
DOI：
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发表时间：
2015
期刊：
影响因子：
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通讯作者：
M. Reorda
中科院分区：
文献类型：
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作者：
A. Touati;A. Bosio;L. Dilillo;P. Girard;A. Virazel;P. Bernardi;M. Reorda
高速延迟故障测试期间的高功耗可能导致成品率损失和过早老化。另一方面，降低太多的测试功率可能导致测试逃逸和可靠性问题。因此，为了避免这些问题，测试功率必须映射功能模式期间消耗的功率。现有的工作目标的功能测试程序的生成能够最大限度地提高微处理器核心的功能模式中的功耗。获得的功耗将用作阈值，以调整测试期间消耗的功率。本文研究的影响，重新使用这些功能测试程序的测试目的。我们建议应用它们，利用现有的DfT架构，以最大限度地提高延迟故障覆盖率。然后，我们将它们与经典的全速测试和LOS延迟故障测试计划，以进一步增加故障覆盖率。结果表明，它是可能的，以实现一个全球性的测试解决方案，能够最大限度地提高延迟故障覆盖率，同时尊重功能的功率预算。
High power consumption during at-speed delay fault testing may lead to yield loss and premature aging. On the other hand, reducing too much test power might lead to test escape and reliability problems. Thus, to avoid these issues, test power has to map the power consumed during functional mode. Existing works target the generation of functional test programs able to maximize the power consumption in functional mode of microprocessor cores. The obtained power consumption will be used as threshold to tune the power consumed during testing. This paper investigates the impact of re-using such functional test programs for testing purposes. We propose to apply them by exploiting existing DfT architecture to maximize the delay fault coverage. Then, we combine them with the classical at-speed LOC and LOS delay fault testing schemes to further increase the fault coverage. Results show that it is possible to achieve a global test solution able to maximize the delay fault coverage while respecting the functional power budget.