Live demonstration: A versatile, low-cost platform for testing large ReRAM cross-bar arrays
Live demonstration: A versatile, low-cost platform for testing large ReRAM cross-bar arrays
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现场演示：用于测试大型 ReRAM 交叉阵列的多功能、低成本平台
DOI：
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发表时间：
2014
期刊：
影响因子：
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通讯作者：
T. Prodromakis
中科院分区：
文献类型：
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作者：
A. Serb;R. Berdan;A. Khiat;C. Papavassiliou;T. Prodromakis
我们演示了忆阻器在跨条存储器阵列中的实际应用。完整的设置只包括一台PC机，一个mBED微控制器和一个承载外部组件的PCB和忆阻器跨条芯片。该系统可用于通用内存存储，但在本例中我们将其用作二进制图像存储设备。MATLAB接口允许用户将二进制图像加载到存储器中，并观察阵列中每个忆阻器的内部存储器状态，以及描述存储器“写”操作的速度和成功程度的关键性能指标。
We demonstrate a practical application of memristors in a cross-bar memory array. The full set-up consists of only a PC, an mBED microcontroller and a PCB hosting external components and the memristor cross-bar chip. The system can be used for general purpose memory storage, but in this case we use it as a binary image storage device. A MATLAB interface allows the user to load a binary image into the memory and observe the resulting internal memory states of each memristor in the array along with key performance metrics describing the speed and degree of success of the memory `write' operation.