Generation and use of parametric X-rays with an electron linear accelerator
Generation and use of parametric X-rays with an electron linear accelerator
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使用电子直线加速器产生和使用参量 X 射线
DOI：
10.1016/s0168-9002(00)01002-0
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发表时间：
2001
影响因子：
1.4
通讯作者：
Kazuaki Imai
中科院分区：
文献类型：
--
作者：
T. Akimoto;M. Tamura;Jiro Ikeda;Y. Aoki;F. Fujita;Koichi Sato;A. Honma;T. Sawamura;M. Narita;Kazuaki Imai
用45 MeV电子直线加速器(LINAC)用硅单晶产生了能量为15~30keV的参量X射线辐射(PXR)。通过理论计算和实验，得到了利用PXR产生良好单色硬X射线场的合适条件。在几十MeV的电子能量范围内，PXR强度与电子能量近似线性增加。PXR能量与晶体的旋转角呈线性关系，与反射面和观察角有关，而与电子能量无关。获得的PXR计数随观测角度的增大而增加，但能量有所降低。实验使用了厚度分别为200、300、400、500、530和625μm的硅板，建立了不同厚度的硅板对角分布的差异。讨论了PXR在材料研究等领域应用的可能性。用X射线衍射仪精确测定了晶体抛光(切割)面的离散角，并测量了晶体K壳层吸收边附近的衰减系数。
Parametric X-ray radiation (PXR) at energies from 15 to 30keV was produced by a 45MeV electron linear accelerator (LINAC) using a silicon (Si) single crystal. The appropriate conditions for generation of good monochromatic hard X-ray fields by PXR were obtained with the LINAC by theoretical calculations and experiments. The PXR intensity increased approximately linearly with the electron energy in the electron energy range of several tens of MeV. The PXR energy increased linearly with the crystal rotation angle that depended on the reflection plane and the observation angle and did not depend on the electron energy. The obtained counts of PXR increased at large observation angles although the energy decreased. The experiments used Si plates with thicknesses of 200, 300, 400, 500, 530, and 625μm. Differences in angular distribution by the thickness of the Si plates were established. The possibility for PXR applications to material research and other fields is discussed. The off angle of the polished (cut) plane of the crystal was accurately determined using the PXR and the attenuation coefficient around the K-shell absorption edge of Zr, Nb and Mo were measured.