Precession electron diffraction and its advantages for structural fingerprinting in the transmission electron microscope
Precession electron diffraction and its advantages for structural fingerprinting in the transmission electron microscope
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DOI：
10.1524/zkri.2010.1162
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发表时间：
2010-01-01
影响因子：
1.2
通讯作者：
Rouvimov, Sergei
中科院分区：
文献类型：
--
作者：
Moeck, Peter;Rouvimov, Sergei
概述了透射电子显微镜中进动电子衍射的基础。简要说明了基于实验室的粉末 X 射线衍射指纹识别对于纳米晶体不可行的事实。提出了一种基于可从进动电子衍射斑点图案中提取的结构数据的纳米晶体结构指纹识别程序。
The foundations of precession electron diffraction in a transmission electron microscope are outlined. A brief illustration of the fact that laboratory-based powder X-ray diffraction fingerprinting is not feasible for nanocrystals is given. A procedure for structural fingerprinting of nanocrystals on the basis of structural data that can be extracted from precession electron diffraction spot patterns is proposed.