Determination of complex transmissivity using x-ray in-line holography and two-beam interferometry
Determination of complex transmissivity using x-ray in-line holography and two-beam interferometry
复制标题
使用 X 射线同轴全息术和双光束干涉测量法确定复数透射率
DOI：
10.1063/1.2753673
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发表时间：
2007
影响因子：
3.2
通讯作者：
S. Goto
中科院分区：
文献类型：
--
作者：
Y. Kohmura;T. Sakurai;T. Ishikawa;A. Takeuchi;Yoshio Suzuki;S. Goto
提出了一种定量测量样品复透射率的方法，在固定的样品-探测器距离下，使用在线全息和附加剪切干涉图。完全确定了探测平面上的波场，并通过反褶积重建了样品的出口面波场。介绍了实验原理和各种样品的成像结果。
A method for quantitative measurement of the complex transmissivity of samples is presented where in-line holography and additional shearing interferograms, at a fixed sample-detector distance, are used. The wave field at the detector plane is completely determined and the exit-face wave field of the sample is reconstructed by deconvolution. The principle of experiment and the results of imaging of various samples are described.