Defect-Oriented Testing
Defect-Oriented Testing
复制标题
面向缺陷的测试
DOI：
10.1007/978-1-4615-2365-9_2
复制
发表时间：
1995
期刊：
影响因子：
--
通讯作者：
A. P. Thijssen
中科院分区：
文献类型：
--
作者：
F. Beenker;R. Bennetts;A. P. Thijssen
The key problem in the electronics industry is the need to improve quality and productivity while reducing costs. This is a simple statement; however, it influences every step of a product-development cycle. For integrated circuits, these development cycles are the design, manufacture and testing cycles. All three cycles have their own specific demands on the information required to improve their productivity and yield. The information packages are clearly correlated; see Figure 2.1.
