Femtosecond Transient Reflecting Grating Methods and Analysis of the Ultrafast Carrier Dynamics on Si(111) Surfaces
Femtosecond Transient Reflecting Grating Methods and Analysis of the Ultrafast Carrier Dynamics on Si(111) Surfaces
复制标题
Si(111)表面超快载流子动力学飞秒瞬态反射光栅方法及分析
DOI:
10.2116/analsci.16.403
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发表时间:
2000
影响因子:
1.6
通讯作者:
A. Harata
中科院分区:
文献类型:
--
作者:
T. Morishita;A. Hibara;T. Sawada;I. Tsuyumoto;A. Harata
The femtosecond transient reflecting grating (TRG) method was developed and applied to monitor the ultrafast dynamics of photo-excited carriers on Si(111) surfaces. TRG responses were measured as a function of the pump beam intensity and fringe spacing, and two relaxation components were observed. An analysis of the results has suggested that the slow component corresponds to carrier diffusion and that the fast component corresponds to a combined process between ballistic transport and carrier-carrier scattering of non-equilibrium carriers.