Automated feature localization for hardware designs using coverage metrics
Automated feature localization for hardware designs using coverage metrics
复制标题
使用覆盖率指标对硬件设计进行自动功能定位
DOI：
--
复制
发表时间：
2012
期刊：
影响因子：
--
通讯作者：
G. Fey
中科院分区：
文献类型：
--
作者：
Jan Malburg;A. Finder;G. Fey
由于越来越复杂的现代片上系统设计是由大型设计团队开发的。此外，现有的设计块被重用，使得关于设计的这些部分的知识完全依赖于文档的质量。对于单个设计师来说，几乎不可能详细了解所有模块及其交互。我们介绍了一种基于仿真的自动化技术来支持设计理解。基于设计人员提供的用例和它们的覆盖信息，建议的技术识别与某个功能特性相关的源代码部分。在两个案例研究中，该技术被证明至少与阅读文档一样精确，并且具有两个重要的优点：自动化方法比被检查设计的现有文档更快，更精确。
Due to the increasing complexity modern System on Chip designs are developed by large design teams. In addition, existing design blocks are re-used such that the knowledge about these parts of the design entirely depends on the quality of the documentation. For a single designer it is almost impossible to have detailed knowledge about all blocks and their interaction. We introduce a simulation-based automation technique to support design understanding. Based on use cases provided by the designer and on their coverage information, the proposed technique identifies parts of the source code that are relevant for a certain functional feature. In two case studies the technique is shown to be at least as exact as reading the documentation with two important advantages: the automated approach is fast and more precise than the existing documentation for the inspected designs.