GEM: performance and aging tests

GEM: performance and aging tests
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GEM：性能和老化测试

DOI：
10.1109/nssmic.1998.775210
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发表时间：
1998
期刊：
1998 IEEE Nuclear Science Symposium Conference Record. 1998 IEEE Nuclear Science Symposium and Medical Imaging Conference (Cat. No.98CH36255)
影响因子：
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通讯作者：
J. Hutchins
J. Hutchins
中科院分区：
--
文献类型：
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作者：
H. Cho;J. Kadyk;S.H. Han;W. Hong;V. Perez;W. Wenzel;K. Pitts;M.D. Martin;J. Hutchins

文献摘要

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已经进行了性能和老化测试来表征气体电子倍增器 (GEM)，包括进一步的设计改进，例如更厚的 GEM 和封闭的 GEM。由于有效 GEM 增益通常小于绝对 GEM 增益，并且由于雪崩电子被捕获在底部 GEM 电极处，因此我们进行了现场模拟和测量以更好地理解，并讨论了消除这种影响的方法。还介绍了 GEM 的其他性能参数，包括绝对 GEM 增益、短期和长期增益稳定性。
Performance and aging tests have been done to characterize gas electron multipliers (GEMs), including further design improvements such as a thicker GEM and a closed GEM. Since the effective GEM gain is typically smaller than the absolute GEM gain, due to trapping of avalanche electrons at the bottom GEM electrode, we performed field simulations and measurements for better understanding, and discuss methods to eliminate this effect. Other performance parameters of the GEMs are also presented, including absolute GEM gain, short-term and long-term gain stabilities.