Inter-laboratory study of eddy-current measurement of excess-carrier recombination lifetime
Inter-laboratory study of eddy-current measurement of excess-carrier recombination lifetime
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过量载流子复合寿命涡流测量的实验室间研究
DOI：
10.1109/jphotov.2013.2284375
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发表时间：
2013
期刊：
影响因子：
--
通讯作者：
J. D. Murphy
中科院分区：
文献类型：
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作者：
Adrienne L. Blum;J. S. Swirhun;R. Sinton;F. Yan;S. Herasimenka;T. Roth;K. Lauer;J. Haunschild;B. Lim;K. Bothe;Z. Hameiri;B. Seipel;R. Xiong;M. Dhamrin;J. D. Murphy
过剩载流子复合寿命是硅太阳电池设计和生产中的一个关键参数。随着涡流硅片和硅砖寿命测试仪器在国际上的广泛使用和最近的标准化（SEMI PV13），量化实验室间和实验室内的可重复性非常重要。本文介绍了一项由24名参与者进行的国际实验室间研究的结果，该研究旨在确定SEMI PV13涡流载流子寿命测量测试方法的精度。总体而言，实验室间的载流子复合寿命重现性在准稳态（QSS）模式下为±11%，在瞬态模式下为±8%，晶圆样品为±4%。
Excess-carrier recombination lifetime is a key parameter in silicon solar cell design and production. With the vast international use and recent standardization (SEMI PV13) of eddy-current wafer and brick silicon lifetime test instruments, it is important to quantify the inter- and intra-laboratory repeatability. This paper presents results of an international inter-laboratory study conducted with 24 participants to determine the precision of the SEMI PV13 eddy-current carrier lifetime measurement test method. Overall, the carrier recombination lifetime between-laboratory reproducibility was found to be within ±11% for quasi-steady-state (QSS) mode and ±8% for transient mode for wafer samples and within ±4% for bulk samples.