Atomic number and electron density measurement using a conventional X-ray tube and a CdTe detector
Atomic number and electron density measurement using a conventional X-ray tube and a CdTe detector
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DOI：
10.1143/jjap.47.7317
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发表时间：
2008-09-01
影响因子：
1.5
通讯作者：
Aoki, Toru
中科院分区：
文献类型：
--
作者：
Zou, Wenjuan;Nakashima, Takuya;Aoki, Toru
为了将双能技术应用于材料识别，提出了一种基于传统x射线管和碲化镉探测器的新型计算机断层扫描系统。该系统可以提供扫描材料在两个不同能量波段的投影数据信息。引入近似后，对实测投影数据进行重构，得到两种不同能量下材料x射线线性衰减系数的分布。然后，采用双能x射线计算机断层扫描（DXCT）方法推导出相应的原子序数和电子密度。通过与理论结果的比较，验证了该系统用于低z材料识别的可行性。
In order to apply the dual-energy technique to material identification, a new computed tomography scanning system was proposed using a conventional X-ray tube and a CdTe detector. This system can provide information of projection data at two distinct energy bands for scanned materials. After introducing an approximation, the measured projection data were reconstructed to obtain the distributions of the X-ray linear attenuation coefficients of the materials at two different energies. Then, the corresponding atomic number and electron density can he derived with the dual-energy X-ray computed tomography (DXCT) method adopted. By comparing the obtained results with theoretical ones, the feasibility of using this system for identifying low-Z materials was demonstrated in this study.